This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoid...
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This volume brings together selected contributed papers presented at the International Conference of Computational Methods in Science and Engineering (ICCMSE 2005), held in Greece, 21 aEURO 26 Octobe...
Collins Primary Science fully meets the requirements of the Cambridge Assessment International Education Primary Science Curriculum Framework and the material has been carefully developed to meet the...
How do you make a clock out of an ice cube? Send messages using bubbles? Make money using a tube that waltzes? This collection of curious and offbeat science experiments provides the answers to these...