With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance.
ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup.
Key...
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This book discusses topics related to power electronics, especially electromagnetic transient analysis and control of high-power electronics conversion. It focuses on the re-evaluation of power electr...
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